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An international team of scientists has developed a novel X-ray technique for imaging atomic displacements in materials with unprecedented accuracy, using a recently discovered class of exotic materials - multiferroics - that can be simultaneously magnetically and electrically ordered. Multiferroics are also candidate materials for new classes of electronic devices. The researchers are from the European Synchrotron Radiation Facility (ESRF) in Grenoble (France), the University of Oxford, and the University College London.