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GHOPTO SWIR camera is based on an in-house developed InGaAs detector with multiple resolutions. The compact GH-SW640-GigE meets requirements of high sensitivity in the SWIR range from 900nm to1700nm and with accompanied by extended wavelength from 400nm to 1700nm options. The camera comes with PAL output and GigE vision interface, supporting 14-bit data transfer and adjustable exposure time. The Short-Wave Infrared (SWIR) GigE/GIG-E vision camera offers unique capabilities for various applications in Industrial inspections as nondestructive test, Si wafer inspection, semiconductor circuit detection, laser beam profiling and process monitoring.